[EGD-4835] Fix HIL Readme, code, so it works, rename, random GCC 10 fix
Polish README, so it works 1:1.
Rename method, so it blends better with its calls.
Delete old code, leave phone unlock.
Try not to see this random GCC 10 fix here.
[EGD-4846] Change default HIL to autodetect Pure phone
No need to pass --port argument by default.
--port still needs to be passed if you want to use specific
phone or Linux simulator
[EGD-4846] Add auto detect USB Pure Phones for HIL
Detect connected Pure phone automatically inside test harness (Python
library) by its Manufacturer and Product strings.
[EGD-4921] Add next harness test cases
Test harness extended with additional tests:
- Making a call to a specific phone number.
- Calling back to the last number from the call log.
- Searching for SMSes with a phone number filter.
[EGD-5004] Add USB-CDC echo mechanism
Added echo mechanism to USB-CDC, update usb_stack submodule
and added a test case to test harness
[EGD-4534] Change audio data path synchronization
Refactor audio data path to fix several synchronization issues and
excessive copy operations on large memory blocks. Introduce
audio::Stream data structure to allow connecting audio source and sink
with a zero-copy capability.
Introduce system mechanisms:
- critical section guard lock needed for stream synchronization
- non-cacheable memory allocator to allocate memory for DMA safe
buffers
Update the Googletest CMake template to match the capabilities of the
Catch2 template.
Signed-off-by: Marcin Smoczyński <smoczynski.marcin@gmail.com>
Signed-off-by: Hubert Chrzaniuk <hubert.chrzaniuk@mudita.com>
Merge branch 'master' into stable
[EGD-4752] tests: fixed contact offset bug, sliced contact test into batches (#1154)
Fix contact offset bug
Slice contact test into batches
Co-authored-by: SP2FET <bartosz.cichocki@mudita.com>
[EDG-4494] Exclude contacts from temporary group (#1109)
* [EDG-4494] Exclude contacts from temporary group
Merge branch 'master' into stable
[EGD-4576] doc: linked to integration tests article (#1111)
Add references to Test harness README article
Added references to Test harness README in two places:
- Documentation table of contents
- Development workflow article
[EGD-4510] testing: added pytest tests, updated documentation (#1096)
Add pytest test and functional tests, update documentation
[EGD-4510] rewritten service-desktop tests into pytest manner
[EGD-4510] updated docs, rewritten FT to pytest manner
Co-authored-by: SP2FET <bartosz.cichocki@mudita.com>
[EGD-4420] added timeout for opening serial port (#1077)
[EGD-4420] added pts to file writing and checking on the test side
Co-authored-by: SP2FET <bartosz.cichocki@mudita.com>
[EGD-3512] Create ICS Parser (#892)
-Create application desktop endpoints for calendar events
-Modify Calendar Database Interface
-Create ParserICS lib
-Create calendar events endpoints test
-Create UT for ParserICS
[EGD-4318] updated test harness defs for service desktop release (#1055)
[EGD-4270] updated test API, added sending message case in test harness (#1042)
[EGD-4270] build fix for GCC 10
Co-authored-by: SP2FET <bartosz.cichocki@mudita.com>
[EGD-4433] update Cathc2 to v2.13.3
[EGD-4319] Added test harness API (#993)
[EGD-4319] added phone lock checking and opening application from harness
Co-authored-by: SP2FET <bartosz.cichocki@mudita.com>